Invention Grant
- Patent Title: Detecting malicious hardware by measuring radio frequency emissions
- Patent Title (中): 通过测量射频发射来检测恶意硬件
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Application No.: US13335281Application Date: 2011-12-22
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Publication No.: US08901916B2Publication Date: 2014-12-02
- Inventor: Phillip D. Jones , Thomas D. Pahel, Jr. , Adam J. Parker , Adrian X. Rodriguez
- Applicant: Phillip D. Jones , Thomas D. Pahel, Jr. , Adam J. Parker , Adrian X. Rodriguez
- Applicant Address: SG Singapore
- Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Current Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agent Katherine S. Brown; Jeffrey L. Streets
- Main IPC: G01R23/14
- IPC: G01R23/14

Abstract:
A method of testing an electronic device includes measuring radio frequency emissions at a plurality of positions relative to a trusted unit of a particular electronicdevice during operation of the trusted unit, and measuring radio frequency emissions at the same plurality of positions relative to a second unit of the particular electronic device. For each of the plurality of positions, the radio frequency emissions measured from the second unit are compared to the radio frequency emissions measured from the trusted unit. The method then determines whether there is any frequency at which the measured amplitude of the radio frequency emissions from the second unit and the measured amplitude of the radio frequency emissions from the trusted unit exhibit a statistically significant difference.
Public/Granted literature
- US20130162241A1 DETECTING MALICIOUS HARDWARE BY MEASURING RADIO FREQUENCY EMISSIONS Public/Granted day:2013-06-27
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