Invention Grant
- Patent Title: Element measurement circuit and method thereof
- Patent Title (中): 元件测量电路及其方法
-
Application No.: US13452619Application Date: 2012-04-20
-
Publication No.: US08901917B2Publication Date: 2014-12-02
- Inventor: Ying-Yen Chen , Jih-Nung Lee , Chun-Yu Yang
- Applicant: Ying-Yen Chen , Jih-Nung Lee , Chun-Yu Yang
- Applicant Address: TW Hsinchu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW100114379A 20110426
- Main IPC: G01R23/14
- IPC: G01R23/14 ; G01R31/28

Abstract:
An element measurement circuit is provided, comprising a oscillator for generating a first oscillation clock and second oscillation clock, a frequency divider for dividing the first oscillation clock to generate a third oscillation clock and for dividing the second oscillation clock to generate a fourth oscillation clock, a frequency detector for detecting the third oscillation clock to generate a first count value and for detecting the fourth oscillation clock to generate a second count value, and a controller for generating a first oscillation period according to the first count value, for generating a second oscillation period according to the second count value, and for generating a measurement value according to the first oscillation period and the second oscillation period.
Public/Granted literature
- US20120274310A1 ELEMENT MEASUREMENT CIRCUIT AND METHOD THEREOF Public/Granted day:2012-11-01
Information query