Invention Grant
- Patent Title: Connector, probe, and method of manufacturing probe
- Patent Title (中): 连接器,探头和探头制造方法
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Application No.: US13353377Application Date: 2012-01-19
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Publication No.: US08901920B2Publication Date: 2014-12-02
- Inventor: Koki Takahashi , Koki Sato , Mitsuru Kobayashi
- Applicant: Koki Takahashi , Koki Sato , Mitsuru Kobayashi
- Applicant Address: JP Tokyo
- Assignee: Fujitsu Component Limited
- Current Assignee: Fujitsu Component Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2011-019165 20110131
- Main IPC: G01R1/06
- IPC: G01R1/06 ; G01R31/20 ; H01R13/24 ; H01R43/16 ; G01R1/067 ; G01R1/073

Abstract:
A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.
Public/Granted literature
- US20120194173A1 CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE Public/Granted day:2012-08-02
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