Invention Grant
- Patent Title: Enforcing performance longevity on semiconductor devices
- Patent Title (中): 在半导体器件上实现性能长寿
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Application No.: US13631271Application Date: 2012-09-28
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Publication No.: US08901953B2Publication Date: 2014-12-02
- Inventor: Abdi Nassib , Gyan Prakash
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Barnes & Thornburg, LLP
- Main IPC: H03K19/00
- IPC: H03K19/00

Abstract:
Technologies for enforcing an expiration policy on an electronic engineering sample component includes a one-time programmable fuse to store a manufacture date of the electronic engineering sample component, another one-time programmable fuse to store an expiration date of the electronic engineering sample component, and a component life management engine to compare a current date of the electronic engineering sample component with the expiration date of the electronic engineering sample component. The component life management engine to disable or lock the electronic engineering sample component in response to determining that the current date of the electronic engineering sample component exceeds the expiration date of the electronic engineering sample component. In some embodiments, a computing device may enforce the expiration policy for the electronic engineering sample component. The computing device may also be communicatively coupled to a remote unlock server and may receive authorization to unlock a disabled engineering sample component.
Public/Granted literature
- US20140091831A1 ENFORCING PERFORMANCE LONGEVITY ON SEMICONDUCTOR DEVICES Public/Granted day:2014-04-03
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