Invention Grant
US08903326B2 Simultaneous downlink testing for multiple devices in radio-frequency test systems
有权
在射频测试系统中同时进行多个设备的下行链路测试
- Patent Title: Simultaneous downlink testing for multiple devices in radio-frequency test systems
- Patent Title (中): 在射频测试系统中同时进行多个设备的下行链路测试
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Application No.: US13018348Application Date: 2011-01-31
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Publication No.: US08903326B2Publication Date: 2014-12-02
- Inventor: Justin Gregg , Adil Syed , Vishwanath Venkataraman
- Applicant: Justin Gregg , Adil Syed , Vishwanath Venkataraman
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Treyz Law Group
- Agent Jason Tsai; Michael H. Lyons
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04W24/06 ; H04L12/26

Abstract:
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.
Public/Granted literature
- US20120122406A1 SIMULTANEOUS DOWNLINK TESTING FOR MULTIPLE DEVICES IN RADIO-FREQUENCY TEST SYSTEMS Public/Granted day:2012-05-17
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