Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test fixture, and a radio-frequency (RF) cable that connects the test unit to the test fixture. A control test setup may be used to calibrate uplink and downlink characteristics associated with each test station (e.g., to determine path loss associated with the RF cable and test fixture and variations associated with the test unit). The control test setup may calibrate each test station at desired frequencies to generate a test station error (offset) table. The test unit of each test station may be individually configured based on the test station error table so that offset is minimized among the different stations and so that the test stations may reliably measure hundreds or thousands of wireless electronic devices during product testing.