Invention Grant
US08904247B2 Test pattern generation apparatus, test program generation apparatus, generation method, program, and test apparatus
有权
测试模式生成装置，测试程序生成装置，生成方法，程序和测试装置
- Patent Title: Test pattern generation apparatus, test program generation apparatus, generation method, program, and test apparatus
- Patent Title (中): 测试模式生成装置，测试程序生成装置，生成方法，程序和测试装置
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Application No.: US13655468Application Date: 2012-10-19
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Publication No.: US08904247B2Publication Date: 2014-12-02
- Inventor: Takuya Toyoda
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2011-258916 20111128
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H04L12/26 ; G01R29/26
Abstract:
A test pattern generating apparatus that generates a test pattern to be communicated with a device under test having a plurality of terminals, the test pattern generating apparatus comprising a primitive generating section that generates a cycle primitive indicating a signal pattern to be communicated with each of the terminals during a base cycle, based on instructions from a user; a device cycle generating section that generates a device cycle indicating signal patterns of a plurality of base cycles, by arranging a plurality of the cycle primitives based on instructions from the user; and a sequence generating section that generates a sequence of the test pattern to be supplied to the device under test, by arranging a plurality of the device cycles based on instructions from the user.
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