An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises a scan chain having a plurality of scan cells. The integrated circuit further comprises a clock distribution network configured to provide clock signals to respective portions of the integrated circuit. The clock distribution network comprises clock gating circuitry configured to control delivery of one or more of the clock signals along respective clock signal lines of the clock distribution network at least in part responsive to a scan shift control signal that is also utilized to cause the scan cells to form a serial shift register during scan testing. The clock gating circuitry may be used to determine whether a clock delay defect that causes a scan error during scan testing will also cause a functional error during functional operation, thereby improving yield in integrated circuit manufacturing.