Invention Grant
- Patent Title: Test support apparatus
- Patent Title (中): 测试支持设备
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Application No.: US13565780Application Date: 2012-08-02
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Publication No.: US08905362B2Publication Date: 2014-12-09
- Inventor: Cong-Xu Hu , Yu-Lan Liu , Yong Ma , Yu-Lin Liu
- Applicant: Cong-Xu Hu , Yu-Lan Liu , Yong Ma , Yu-Lin Liu
- Applicant Address: CN Wuhan TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (WuHan) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Wuhan TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110429315 20111220
- Main IPC: F16M11/06
- IPC: F16M11/06
Abstract:
A test support apparatus includes a base, a support bracket, a first positioning member mounted to the support bracket; and a positioning arm. The support bracket is pivotally mounted to the base and keeps an angle relative to the base. The support bracket supports a product. The positioning arm defines an elongated positioning slot. The positioning arm is mounted to the base. The first positioning member is positioned in different positions of the elongated positioning slot to change the angle.
Public/Granted literature
- US20130153732A1 TEST SUPPORT APPARATUS Public/Granted day:2013-06-20
Information query
IPC分类:
