Invention Grant
- Patent Title: Base material with single-crystal silicon carbide film, method of producing single-crystal silicon carbide film, and method of producing base material with single-crystal silicon carbide film
- Patent Title (中): 具有单晶碳化硅膜的基材,单晶碳化硅膜的制造方法以及使用单晶碳化硅膜制造基材的方法
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Application No.: US13173646Application Date: 2011-06-30
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Publication No.: US08906487B2Publication Date: 2014-12-09
- Inventor: Hiroyuki Shimada
- Applicant: Hiroyuki Shimada
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2010-164778 20100722
- Main IPC: B32B3/24
- IPC: B32B3/24 ; B32B3/30 ; C30B25/02 ; C30B25/04 ; C30B25/18 ; H01L21/20 ; H01L21/205 ; C30B29/36 ; H01L21/02 ; C30B29/06

Abstract:
In a base material with a single-crystal silicon carbide film according to an embodiment of the invention, a plurality of recessed portions is formed on the surface of a silicon substrate, an insulating film including silicon oxide is formed across the surface of the silicon substrate including the inner surfaces of the recessed portions, the top surfaces of side wall portions of recessed portions of the insulating film form flat surfaces, a single-crystal silicon carbide film is joined on the flat surfaces, and the recessed portions below the single-crystal silicon carbide film form holes.
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