Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US13717512Application Date: 2012-12-17
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Publication No.: US08906775B2Publication Date: 2014-12-09
- Inventor: Heung-Jae Cho , Eui-Seong Hwang , Tae-Yoon Kim , Kyu-Hyung Yoon
- Applicant: SK Hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2012-0112486 20121010
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L29/02 ; H01L49/02 ; H01L21/18 ; H01L27/108

Abstract:
A method for fabricating a semiconductor device includes forming a first semiconductor wafer, in which a circuit part and a first bonding layer are stacked, on a first semiconductor substrate, forming a second semiconductor wafer, which includes structures and an insulating layer for gap-filling between the structures, on a second semiconductor substrate, the structures including a pillar and bit lines stacked therein, bonding the first semiconductor wafer with the second semiconductor wafer so that the first bonding layer faces the insulating layer, and separating the second semiconductor substrate from the bonded second semiconductor wafer.
Public/Granted literature
- US20140097519A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2014-04-10
Information query
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