Invention Grant
- Patent Title: Test apparatus having optical interface and test method
- Patent Title (中): 具有光学接口和测试方法的测试设备
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Application No.: US13038344Application Date: 2011-03-01
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Publication No.: US08907696B2Publication Date: 2014-12-09
- Inventor: Shin Masuda
- Applicant: Shin Masuda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2010-113315 20100517
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/311 ; G01R31/319 ; G01R31/317 ; G01R31/302

Abstract:
There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.
Public/Granted literature
- US20110279109A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-11-17
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