Invention Grant
US08908170B2 Method for detecting defect of display panel and related detecting device
有权
检测显示面板及相关检测装置缺陷的方法
- Patent Title: Method for detecting defect of display panel and related detecting device
- Patent Title (中): 检测显示面板及相关检测装置缺陷的方法
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Application No.: US13809007Application Date: 2013-01-04
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Publication No.: US08908170B2Publication Date: 2014-12-09
- Inventor: Yung-Yu Lin
- Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Shenzhen, Guangdong
- Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Current Assignee: Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong
- Agent Andrew C. Cheng
- Priority: CN201210580603 20121227
- International Application: PCT/CN2013/070005 WO 20130104
- International Announcement: WO2014/101304 WO 20140703
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G06K9/00 ; G01N21/88

Abstract:
The present invention provides a method for detecting a defect of a display panel and related defect detecting device. The method includes: utilizing lights having different colors to illuminate the display panel; obtaining a plurality of corresponding grey-scale diagrams when the lights illuminate the display panel; and determining whether the display panel has a defect. If the grey-scale diagrams indicate a grey-scale difference, determining that the display panel has a defect. In this way, the present invention is able to raise defect detecting ability for the display panel and prevent from missing the defects.
Public/Granted literature
- US20140185048A1 Method for Detecting Defect of Display Panel and Related Detecting Device Public/Granted day:2014-07-03
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