Invention Grant
- Patent Title: X-ray imaging apparatus and X-ray imaging method
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US13581498Application Date: 2011-02-23
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Publication No.: US08908829B2Publication Date: 2014-12-09
- Inventor: Masatoshi Watanabe , Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda
- Applicant: Masatoshi Watanabe , Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-049313 20100305
- International Application: PCT/JP2011/054667 WO 20110223
- International Announcement: WO2011/108555 WO 20110909
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01N23/02 ; G01T1/00 ; A61B6/00

Abstract:
Provided is an X-ray imaging apparatus and an X-ray imaging method that offer an alternative for a refraction contrast method.A first scintillator and a second scintillator are used, the first scintillator generating first fluorescent light when X-rays separated by the separating element are incident thereon, and a second scintillator generating second fluorescent light when X-rays separated by the separating element are incident thereon. The second scintillator has a fluorescence emission intensity gradient such that an amount of emitted fluorescent light changes in accordance with a change in a position at which the X-rays are incident.
Public/Granted literature
- US20120321042A1 X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD Public/Granted day:2012-12-20
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