Invention Grant
- Patent Title: Image analysis method and image analysis apparatus
- Patent Title (中): 图像分析方法和图像分析装置
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Application No.: US13168544Application Date: 2011-06-24
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Publication No.: US08908993B2Publication Date: 2014-12-09
- Inventor: Akemi Suzuki
- Applicant: Akemi Suzuki
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-145607 20100625
- Main IPC: G06K9/64
- IPC: G06K9/64 ; G06K9/34 ; G02B21/36 ; G06T7/00

Abstract:
An image analysis method includes acquiring images of spatially different analysis regions. Each of the images of the analysis regions is constituted by pixels including a plurality of data acquired simultaneously or time-serially. The method further includes obtaining a cross-correlation between two analysis regions by using data of pixels of images of the analysis regions.
Public/Granted literature
- US20110317910A1 IMAGE ANALYSIS METHOD AND IMAGE ANALYSIS APPARATUS Public/Granted day:2011-12-29
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