Invention Grant
- Patent Title: Pattern recognition of a distribution function
- Patent Title (中): 分布函数的模式识别
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Application No.: US13327801Application Date: 2011-12-16
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Publication No.: US08909685B2Publication Date: 2014-12-09
- Inventor: Sylvia Scheu , Matthias Buehl , Boris Oliver Kneisel
- Applicant: Sylvia Scheu , Matthias Buehl , Boris Oliver Kneisel
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Main IPC: G06F17/10
- IPC: G06F17/10

Abstract:
Various embodiments of systems and methods for pattern recognition of a distribution function are described herein. An influenced distribution function corresponding to an influenced attribute is compared with other distribution functions corresponding to other attributes. Based on the comparison, a correlation is determined between the influenced distribution function and an influencing distribution function from the other distribution functions. Based on the determination, a raw distribution function corresponding to an influenced attribute is extracted using the influenced distribution function and the influencing distribution function. The extracted raw distribution function and the influencing distribution function may be classified.
Public/Granted literature
- US20130159370A1 PATTERN RECOGNITION OF A DISTRIBUTION FUNCTION Public/Granted day:2013-06-20
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