A test-ahead feature for non-volatile memory-based mass storage devices to anticipate device failure. The test-ahead feature includes a method performed with a solid-state mass storage device having a controller, a cache memory, and at least one non-volatile memory device. At least a first block is reserved on the at least one non-volatile memory device as a wear-indicator block and a plurality of second blocks are used for data storage. Information is stored corresponding to the number of write and erase cycles encountered by the second blocks during usage of the mass storage device, and the information is accessed to perform wear leveling among the second blocks. The wear-indicator blocks are subjected to an offset number of write and erase cycles in excess of the number of write and erase cycles encountered by the second blocks, after which an integrity check of the first block is performed.