Invention Grant
- Patent Title: Probe assembly for a scanning probe microscope
- Patent Title (中): 探针组件用于扫描探针显微镜
-
Application No.: US12447876Application Date: 2007-10-31
-
Publication No.: US08910311B2Publication Date: 2014-12-09
- Inventor: Andrew Humphris , David Catto
- Applicant: Andrew Humphris , David Catto
- Applicant Address: GB Oxfordshire
- Assignee: Infinitesima Ltd.
- Current Assignee: Infinitesima Ltd.
- Current Assignee Address: GB Oxfordshire
- Agency: Volpe and Kornig, P.C.
- Priority: GB0621560.2 20061031
- International Application: PCT/GB2007/004160 WO 20071031
- International Announcement: WO2008/053217 WO 20080508
- Main IPC: G01Q10/00
- IPC: G01Q10/00 ; G01Q70/06 ; B82Y35/00

Abstract:
A probe assembly is for use in a scanning probe microscope. The probe assembly includes a carrier having a plurality of at least three substantially identical probes, each probe having a tip that is located on a plane that is common to the plurality of probe tips and that is movable from this plane. The assembly also includes addressing means adapted to select one of the plurality of probes for relative movement with respect to a majority of the remainder of the probes. Such an assembly, with its potential to facilitate rapid, perhaps automated, replacement of a used probe, lends itself to use in high-speed scanning apparatus.
Public/Granted literature
- US20100186132A1 PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE Public/Granted day:2010-07-22
Information query