Invention Grant
- Patent Title: Nonvolatile memory device
- Patent Title (中): 非易失性存储器件
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Application No.: US13848318Application Date: 2013-03-21
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Publication No.: US08916846B2Publication Date: 2014-12-23
- Inventor: Shigeki Kobayashi , Takeshi Yamaguchi , Yasuhiro Nojiri , Masaki Yamato , Hiroyuki Fukumizu
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H01L29/02
- IPC: H01L29/02 ; H01L47/00 ; H01L45/00 ; H01L27/24

Abstract:
According to one embodiment, a nonvolatile memory device includes a first wiring, a second wiring, and a memory cell provided between the first wiring and the second wiring. The memory cell includes a memory layer, a rectifying element layer, and a protective resistance layer including a first semiconductor layer of a first conductivity type and a second semiconductor layer of a second conductivity type.
Public/Granted literature
- US20140061567A1 NONVOLATILE MEMORY DEVICE Public/Granted day:2014-03-06
Information query
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