Invention Grant
- Patent Title: Method of calibrating an atomic-functioning apparatus
- Patent Title (中): 校准原子功能装置的方法
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Application No.: US13226086Application Date: 2011-09-06
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Publication No.: US08917091B2Publication Date: 2014-12-23
- Inventor: Matthieu Le Prado , Jean-Michel Leger
- Applicant: Matthieu Le Prado , Jean-Michel Leger
- Applicant Address: FR Paris
- Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
- Current Assignee: Commissariat à l'énergie atomique et aux énergies alternatives
- Current Assignee Address: FR Paris
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1057085 20100907
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01C19/62 ; G04F5/14 ; G01R33/26 ; G01C25/00
Abstract:
This method makes it possible to carry out the auto-calibration of the electromagnetic coils of an apparatus such as an atomic clock, a magnetometer or a gyroscope by injecting successive currents into the coils and measuring the magnetic fields induced in order to calculate the transfer coefficients (field/current) of each of the coils and the real angles that they form with very great precision.
Public/Granted literature
- US20120062221A1 METHOD OF CALIBRATING AN ATOMIC-FUNCTIONING APPARATUS Public/Granted day:2012-03-15
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