Invention Grant
US08917102B2 Method, capacitance meter, computer program and computer program product for improved capacitance measurement
有权
方法，电容计，计算机程序和计算机程序产品，用于改进电容测量
- Patent Title: Method, capacitance meter, computer program and computer program product for improved capacitance measurement
- Patent Title (中): 方法，电容计，计算机程序和计算机程序产品，用于改进电容测量
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Application No.: US12884273Application Date: 2010-09-17
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Publication No.: US08917102B2Publication Date: 2014-12-23
- Inventor: Alf Brodin , Jon Lissmats , Jerry Svedlund , Hans Olof Fröjd
- Applicant: Alf Brodin , Jon Lissmats , Jerry Svedlund , Hans Olof Fröjd
- Applicant Address: CH Zürich
- Assignee: ABB Technology AG
- Current Assignee: ABB Technology AG
- Current Assignee Address: CH Zürich
- Agency: Venable LLP
- Agent Eric J. Franklin
- Priority: EP09170649 20090918
- Main IPC: G01R27/26
- IPC: G01R27/26
Abstract:
A method for measuring a capacitance using a capacitance meter. The capacitance meter includes an AC power source with a controllable frequency which is fed to a capacitor to measure its capacitance. A first measurement of the capacitance is performed by the capacitance meter using a first frequency. When the first measurement of the capacitance indicates the capacitance is below a threshold capacitance a lower capacitance measurement is performed in the capacitance meter, using a second measurement of the capacitance using a second frequency. When the first measurement of the capacitance indicates the capacitance is above a threshold capacitance, a higher capacitance measurement is performed in the capacitance meter, using a second measurement of the capacitance using a third frequency, the third frequency being lower than the second frequency.
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