Invention Grant
- Patent Title: Image overlaying and comparison for inventory display auditing
- Patent Title (中): 图像覆盖和库存显示审核比较
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Application No.: US13217031Application Date: 2011-08-24
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Publication No.: US08917902B2Publication Date: 2014-12-23
- Inventor: Michael A. Hicks
- Applicant: Michael A. Hicks
- Applicant Address: US IL Schaumburg
- Assignee: The Nielsen Company (US), LLC
- Current Assignee: The Nielsen Company (US), LLC
- Current Assignee Address: US IL Schaumburg
- Agency: Hanley, Flight & Zimmerman, LLC
- Main IPC: G06K9/32
- IPC: G06K9/32 ; G06K9/62 ; G06Q10/08

Abstract:
Image overlaying and comparison for inventory display auditing is disclosed herein. An example method to perform inventory display auditing disclosed herein comprises overlaying a reference image over a current image displayed on a camera display, the reference image corresponding to an inventory display to be audited, comparing the reference image and the current image to determine whether the current image and the reference image correspond to a same scene and when the reference image and the current image are determined to correspond to the same scene, indicating a difference region in the current image displayed on the camera display, the difference region being a first region of the current image that differs from a corresponding first region of the reference image.
Public/Granted literature
- US20130051611A1 IMAGE OVERLAYING AND COMPARISON FOR INVENTORY DISPLAY AUDITING Public/Granted day:2013-02-28
Information query