Invention Grant
US08918681B2 Test module generation apparatus, test procedure generation apparatus, generation method, program, and test apparatus
有权
测试模块生成装置,测试程序生成装置,生成方法,程序和测试装置
- Patent Title: Test module generation apparatus, test procedure generation apparatus, generation method, program, and test apparatus
- Patent Title (中): 测试模块生成装置,测试程序生成装置,生成方法,程序和测试装置
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Application No.: US13655467Application Date: 2012-10-19
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Publication No.: US08918681B2Publication Date: 2014-12-23
- Inventor: Hiroya Korogi , Kuniaki Isohata , Naohiro Fujikake , Takuya Toyoda
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2011-258903 20111128
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263

Abstract:
Provided is a test module generation apparatus that generates a test module executed on a test apparatus for testing a device under test. The apparatus includes a condition file generating section in which a test condition is input and that generates a condition file specifying the input test condition, a test method storing section that stores a test method, a test method selecting section that receives, from a user, a selection instruction of the test method adapted to the test module to be generated, a condition file selecting section that receives, from a user, a selection instruction of the condition file corresponding to a parameter which the selected test method requires, and a test module generating section that generates the test module in which a test according to the selected test method is executed with a parameter specified by the condition file.
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