Invention Grant
- Patent Title: In situ cleaning device for lithographic apparatus
- Patent Title (中): 光刻设备原位清洁装置
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Application No.: US13462013Application Date: 2012-05-02
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Publication No.: US08921807B2Publication Date: 2014-12-30
- Inventor: Hiromitsu Takase , Ichiro Tanaka , Akira Miyake
- Applicant: Hiromitsu Takase , Ichiro Tanaka , Akira Miyake
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2011-104739 20110509
- Main IPC: H01J37/30
- IPC: H01J37/30 ; B08B5/00 ; H01J37/317

Abstract:
A lithographic apparatus which performs drawing on a substrate with a charged-particle beam, includes an optical system having an aperture plate in which a first number of apertures are formed to pass a first number of charged-particle beams to perform the drawing, a substrate holder, a cleaning unit configured to clean the aperture plate, and a chamber containing the optical system and the substrate holder. The cleaning unit includes a case having an emitting hole plate in which a second number of emitting holes are formed, the second number being smaller than the first number, an active species source configured to generate active species in the case, and a driving mechanism configured to move the case.
Public/Granted literature
- US20120288799A1 CHARGED-PARTICLE BEAM LITHOGRAPHIC APPARATUS AND METHOD OF MANUFACTURING DEVICE Public/Granted day:2012-11-15
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