Invention Grant
- Patent Title: Method of providing a semiconductor structure with forming a sacrificial structure
- Patent Title (中): 提供形成牺牲结构的半导体结构的方法
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Application No.: US13973159Application Date: 2013-08-22
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Publication No.: US08921954B2Publication Date: 2014-12-30
- Inventor: Thoralf Kautzsch , Stefan Kolb , Boris Binder , Bernd Foeste , Marco Mueller
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Main IPC: H01L29/84
- IPC: H01L29/84 ; H01L21/00 ; H01L21/311 ; B81C1/00 ; G01L9/00 ; B81B3/00 ; G01L19/06 ; H04R31/00 ; H04R19/00 ; H04R19/04

Abstract:
A method for providing a semiconductor structure includes forming a sacrificial structure by etching a plurality of trenches from a first main surface of a substrate. The method further includes covering the plurality of trenches at the first main surface with a cover material to define cavities within the substrate, removing a part of the substrate from a second main surface opposite to the first main surface to a depth at which the plurality of trenches are present, and etching away the sacrificial structure from the second main surface of the substrate.
Public/Granted literature
- US20130334624A1 METHOD OF PROVIDING A SEMICONDUCTOR STRUCTURE WITH FORMING A SACRIFICIAL STRUCTURE Public/Granted day:2013-12-19
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