Invention Grant
- Patent Title: Device and method for controlling test material
- Patent Title (中): 用于控制试验材料的装置和方法
-
Application No.: US12601205Application Date: 2008-05-15
-
Publication No.: US08922642B2Publication Date: 2014-12-30
- Inventor: Thomas Vetterlein
- Applicant: Thomas Vetterlein
- Applicant Address: US IL Glenview
- Assignee: Illinois Tool Works Inc.
- Current Assignee: Illinois Tool Works Inc.
- Current Assignee Address: US IL Glenview
- Agency: Lowe Hauptman & Ham LLP
- Priority: DE102007024058 20070522
- International Application: PCT/US2008/063664 WO 20080515
- International Announcement: WO2008/147702 WO 20081204
- Main IPC: H04N7/18
- IPC: H04N7/18 ; B44C1/14 ; G01N21/91 ; B32B15/04 ; G01N27/84 ; B32B7/04

Abstract:
The invention relates to apparatus monitoring test media used in or applicable to magnetic testing, said apparatus comprising a test element fitted with an artificial defect and a test medium feed and a test return as well as a magnetic field generator, further a magnetic field adjustment unit to adjust the magnetic field strength acting on the test element and/or the artificial defect, being adjustable at different magnetic field intensities to check the test medium, and to a corresponding method.
Public/Granted literature
- US20100182422A1 DEVICE AND METHOD FOR CONTROLLING TEST MATERIAL Public/Granted day:2010-07-22
Information query