Invention Grant
US08922776B2 Confocal laser scanning microscope and a method for investigating a sample 有权
共聚焦激光扫描显微镜和样品调查方法

Confocal laser scanning microscope and a method for investigating a sample
Abstract:
A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.
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