Invention Grant
- Patent Title: Confocal laser scanning microscope and a method for investigating a sample
- Patent Title (中): 共聚焦激光扫描显微镜和样品调查方法
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Application No.: US13988784Application Date: 2011-11-22
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Publication No.: US08922776B2Publication Date: 2014-12-30
- Inventor: Reiner Rygiel
- Applicant: Reiner Rygiel
- Applicant Address: DE Wetzler
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzler
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102010060747 20101123
- International Application: PCT/EP2011/070623 WO 20111122
- International Announcement: WO2012/069443 WO 20120531
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01J3/02 ; G01J3/14 ; G01J3/36 ; G02B21/00 ; G02B27/14

Abstract:
A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.
Public/Granted literature
- US20130342834A1 CONFOCAL LASER SCANNING MICROSCOPE AND A METHOD FOR EXAMINING A SAMPLE Public/Granted day:2013-12-26
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