Invention Grant
- Patent Title: Method and arrangement in a measuring system
- Patent Title (中): 测量系统中的方法和布置
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Application No.: US10774948Application Date: 2004-02-10
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Publication No.: US08923599B2Publication Date: 2014-12-30
- Inventor: Anders Åström , Erik Åstrand
- Applicant: Anders Åström , Erik Åstrand
- Applicant Address: SE Linkoping
- Assignee: Sick IVP AB
- Current Assignee: Sick IVP AB
- Current Assignee Address: SE Linkoping
- Agency: Fish & Richardson P.C.
- Priority: SE0103279 20011002
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N33/46 ; G01N21/898 ; G01B11/25 ; G01B11/30

Abstract:
The present invention relates to a method and an arrangement for representing the characteristics of an object with a measuring system, in which either the measuring system or the object is designed to move in relation to one another in a predefined direction of movement. The object preferably is designed to move in relation to the measuring system. At least one light source is designed to illuminate the object with a light which is incident upon the object and has a limited extension in the direction of movement. An imaging sensor, which is arranged on the same side of the object as the light source is designed to pick up light reflected from the object and to convert this into electrical charges. An image-processing unit is furthermore designed to create a digital representation of the object from said electrical charges. The light source is arranged at a predetermined distance from the imaging sensor viewed in the direction of movement, and the image-processing unit is designed to simultaneously read out information on the geometric profile of the object and information on the light scatter in a predetermined area around said profile.
Public/Granted literature
- US20040234118A1 Method and arrangement in a measuring system Public/Granted day:2004-11-25
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