Systems and methods of determining a predicted usable life of components, such as a photoreceptor, associated with an imaging device. The systems and methods include a power source configured to increase an electric field across the photoreceptor. A sensor or array is configured to detect charge deficient spots (CDS) in a charge transport layer (CTL) of the photoreceptor as a result of increasing the electric field. The systems and methods are configured to determine the predicted useable life of the photoreceptor based on the detected CDS. The systems and methods are further configured to output a report of the estimation. The estimation is conducted at fixed or variable intervals throughout the life of the photoreceptor and/or imaging device.