Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US13051410Application Date: 2011-03-18
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Publication No.: US08926901B2Publication Date: 2015-01-06
- Inventor: Kazunori Mototsu
- Applicant: Kazunori Mototsu
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-074202 20100329
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/04 ; B01L3/00 ; B01L9/00 ; G01N35/00

Abstract:
A sample analyzer that analyzes a sample by using a reagent contained in a reagent container is disclosed. The sample analyzer includes a container holding unit which is configured to hold a plurality of reagent containers, and a plurality of electronic tags is attached to the plurality of reagent containers, on which a reagent information regarding reagents is recorded. The sample analyzer further includes an antenna section which emits a radio wave to an electronic tag of a reagent container. A range of the radio wave emitted from the antenna section to the electronic tag is limited to a predetermined range or by a limiting member which is arranged between the antenna section and the electronic tag of the reagent container, and which is configured to limit a range of the radio wave emitted from the antenna section to the electronic tag.
Public/Granted literature
- US20110236259A1 SAMPLE ANALYZER Public/Granted day:2011-09-29
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