Invention Grant
- Patent Title: Method for manufacturing deep-trench super PN junctions
- Patent Title (中): 深沟超PN结的制造方法
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Application No.: US13878453Application Date: 2012-05-31
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Publication No.: US08927386B2Publication Date: 2015-01-06
- Inventor: Tzong Shiann Wu , Genyi Wang , Leibing Yuan , Pengpeng Wu
- Applicant: Tzong Shiann Wu , Genyi Wang , Leibing Yuan , Pengpeng Wu
- Applicant Address: CN Wuxi CN Wuxi
- Assignee: CSMC Technologies FAB1 Co., Ltd.,CSMC Technologies FAB2 Co., Ltd.
- Current Assignee: CSMC Technologies FAB1 Co., Ltd.,CSMC Technologies FAB2 Co., Ltd.
- Current Assignee Address: CN Wuxi CN Wuxi
- Agency: Anova Law Group, PLLC
- Priority: CN201110151784 20110608
- International Application: PCT/CN2012/076353 WO 20120531
- International Announcement: WO2012/167715 WO 20121213
- Main IPC: H01L21/04
- IPC: H01L21/04 ; H01L21/761 ; H01L29/66 ; H01L29/06 ; H01L21/3065

Abstract:
The present invention provides a method for manufacturing a deep-trench super PN junction. The method includes: a deposition step for forming an epitaxial layer on a substrate; forming a first dielectric layer and a second dielectric layer in sequence on the epitaxial layer; forming deep trenches in the epitaxial layer; completely filling the deep trenches with an epitaxial material and the epitaxial material is beyond the second dielectric layer; filling the entire surface of the second dielectric layer and the epitaxial layer such as Si using a third dielectric to from a surface filling layer with a predetermined height; etching back on the surface filling layer to the interface of the first dielectric layer and the epitaxial layer; and a removing step for removing the first dielectric layer, the second dielectric layer and the surface filling layer to planarize Si epitaxial material.
Public/Granted literature
- US20130196489A1 METHOD FOR MANUFACTURING DEEP-TRENCH SUPER PN JUNCTIONS Public/Granted day:2013-08-01
Information query
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