Invention Grant
- Patent Title: Semiconductor device, method for manufacturing the semiconductor device, and method for controlling the semiconductor device
- Patent Title (中): 半导体装置,半导体装置的制造方法以及半导体装置的控制方法
-
Application No.: US13863374Application Date: 2013-04-15
-
Publication No.: US08928030B2Publication Date: 2015-01-06
- Inventor: Hong-fei Lu
- Applicant: Fuji Electric Co., Ltd.
- Applicant Address: JP Kawasaki-Shi
- Assignee: Fuji Electric Co., Ltd.
- Current Assignee: Fuji Electric Co., Ltd.
- Current Assignee Address: JP Kawasaki-Shi
- Agency: Rabin & Berdo, P.C.
- Priority: JP2012-235180 20121024
- Main IPC: H01L29/739
- IPC: H01L29/739 ; H01L29/74 ; H01L21/8238 ; H03K17/66 ; H01L29/66 ; H01L29/32 ; H01L29/40 ; H01L29/06 ; H01L29/08 ; H03K17/567

Abstract:
An A-NPC circuit is configured so that the intermediate potential of two connected IGBTs is clamped by a bidirectional switch including two RB-IGBTs. Control is applied to the turn-on di/dt of the IGBTs during the reverse recovery of the RB-IGBTs. The carrier life time of an n− drift region in each RB-IGBT constituting the bidirectional switch is comparatively longer than that in a typical NPT structure device. A low life time region is also provided in the interface between the n− drift region and a p collector region, and extends between the n− drift region and the p collector region. Thus, it is possible to provide a low-loss semiconductor device, a method for manufacturing the semiconductor device and a method for controlling the semiconductor device, in which the reverse recovery loss is reduced while the reverse recovery current peak and the jump voltage peak during reverse recovery are suppressed.
Public/Granted literature
Information query
IPC分类: