Invention Grant
- Patent Title: Transistor and method of fabricating the same
- Patent Title (中): 晶体管及其制造方法
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Application No.: US12903220Application Date: 2010-10-13
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Publication No.: US08928046B2Publication Date: 2015-01-06
- Inventor: Jing-Yi Yan , Chu-Yin Hung , Hsiao-Chiang Yao , Yen-Yu Wu , Yen-Shih Huang
- Applicant: Jing-Yi Yan , Chu-Yin Hung , Hsiao-Chiang Yao , Yen-Yu Wu , Yen-Shih Huang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW99111954A 20100416
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/66 ; H01L27/12 ; H01L29/417 ; H01L29/786 ; H01L27/32

Abstract:
A transistor including a gate, an active stacked structure, a dielectric layer, a source and a drain. The gate is located over a first surface of the dielectric layer. The active stacked structure, including a first active layer and a second active layer, is located over a second surface of the dielectric layer. The source and the drain are located over the second surface of the dielectric layer and at two sides of the active stacked structure and extend between the first active layer and the second active layer of the active stacked structure.
Public/Granted literature
- US20110254061A1 TRANSISTOR AND METHOD OF FABRICATING THE SAME Public/Granted day:2011-10-20
Information query
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