A gate driving circuit for driving an insulated gate switching element, including a gate charging circuit configured to charge gate capacitance of the insulated gate switching element, and a gate discharging circuit that is connected in series with the gate charging circuit and configured to discharge a charge of the gate capacitance. The gate charging circuit includes a first p-channel metal oxide semiconductor field effect transistor (MOSFET), and a first hybrid normally-on enhancement MOSFET insertion (NOEMI) circuit connected in series with a drain of the first p-channel MOSFET. The gate discharging circuit includes a first n-channel MOSFET, and a second hybrid NOEMI circuit connected in series with a drain of the first n-channel MOSFET.