Invention Grant
- Patent Title: Scan/scan enable D flip-flop
- Patent Title (中): 扫描/扫描使能D触发器
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Application No.: US12771157Application Date: 2010-04-30
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Publication No.: US08928378B2Publication Date: 2015-01-06
- Inventor: Miaosong Wu
- Applicant: Miaosong Wu
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Priority: CN201010132578 20100324
- Main IPC: H03K3/289
- IPC: H03K3/289 ; H03K3/037 ; G01R31/3185

Abstract:
In accordance with an embodiment, an integrated circuit comprises a master-slave flip-flop, a selection logic circuit, and a pass structure. The selection logic circuit is configured to selectively enable or disable one or more clock signals. The pass structure is configured to pass a data signal to the master-slave flip-flop in response to a selected clock signal being enabled.
Public/Granted literature
- US20110234283A1 Scan/Scan Enable D Flip-Flop Public/Granted day:2011-09-29
Information query
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