Invention Grant
US08928378B2 Scan/scan enable D flip-flop 有权
扫描/扫描使能D触发器

Scan/scan enable D flip-flop
Abstract:
In accordance with an embodiment, an integrated circuit comprises a master-slave flip-flop, a selection logic circuit, and a pass structure. The selection logic circuit is configured to selectively enable or disable one or more clock signals. The pass structure is configured to pass a data signal to the master-slave flip-flop in response to a selected clock signal being enabled.
Public/Granted literature
Information query
Patent Agency Ranking
0/0