Invention Grant
- Patent Title: High-linearity phase frequency detector
- Patent Title (中): 高线性相位频率检测器
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Application No.: US13465556Application Date: 2012-05-07
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Publication No.: US08928417B2Publication Date: 2015-01-06
- Inventor: David Canard
- Applicant: David Canard
- Applicant Address: JP Tokyo
- Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee: Asahi Kasei Microdevices Corporation
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: H03L7/00
- IPC: H03L7/00 ; H03L7/085 ; H03L7/089

Abstract:
A phase frequency detector realizes a highly linear conversion from noise-shaped ΣΔ modulation into charge quantities without degradation of phase-locked loop (PLL) phase noise. The phase frequency detector may feature a construction of an Up signal output and a Down signal output, in which the Up signal rises when a divided VCO input rises, an Up signal falls when the divided VCO input falls, a Down signal rises when the divided VCO input rises, and a Down signal falls when a reference input rises. A mode selection input may be utilized for a fast lock-up PLL.
Public/Granted literature
- US20130293315A1 High-Linearity Phase Frequency Detector Public/Granted day:2013-11-07
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