Invention Grant
- Patent Title: ADC calibration
- Patent Title (中): ADC校准
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Application No.: US13526147Application Date: 2012-06-18
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Publication No.: US08928508B2Publication Date: 2015-01-06
- Inventor: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- Applicant: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman & Ham, LLP
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/36

Abstract:
An analog-to-digital converter (ADC) including a plurality of comparators connected to the ADC. The ADC further includes a first pair of terminals and a second pair of terminals connected to each of the plurality of comparators. The ADC further includes a first pair of switches coupled to each of the first pair of terminals and a second pair of switches coupled to each of the second pair of terminals, where the first and second pair of switches are configured to alternate a corresponding comparator between normal operation and a calibration configuration. Comparators other than the corresponding comparator are configured for normal operation if the corresponding comparator is configured to be calibrated.
Public/Granted literature
- US20120249351A1 ADC CALIBRATION Public/Granted day:2012-10-04
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