Invention Grant
- Patent Title: Temperature modulated refractive index measurement
- Patent Title (中): 温度调制折射率测量
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Application No.: US13818102Application Date: 2011-08-02
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Publication No.: US08928872B2Publication Date: 2015-01-06
- Inventor: Ulrich Muller , Jan Kristian Kruger
- Applicant: Ulrich Muller , Jan Kristian Kruger
- Applicant Address: DE
- Assignee: Anton Paar Optotec GmbH
- Current Assignee: Anton Paar Optotec GmbH
- Current Assignee Address: DE
- Agency: Polster Lieder
- Priority: LU91723 20100823
- International Application: PCT/EP2011/063311 WO 20110802
- International Announcement: WO2012/025346 WO 20120301
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01N21/43 ; G01N21/17

Abstract:
The present invention is directed to temperature modulated refractive index measurement. In accordance with the invention a method for determination of the complex temperature coefficient of the refractive index of a sample is provided, wherein the determination of the complex temperature coefficient of the refractive index of the sample is based on a refractive index measurement. Furthermore, the refractive index of the sample is measured over a period of time, wherein the temperature of the sample is modulated over said period of time and the complex temperature coefficient of the refractive index is calculated on the basis of the refractive index measurement over the period of time and the temperature modulation over the period of time. Additionally, a measurement system, in particular comprising a temperature control system and a processing system to carry out the above method, is disclosed.
Public/Granted literature
- US20130155395A1 Temperature Modulated Refractive Index Measurement Public/Granted day:2013-06-20
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