Invention Grant
US08928885B1 Gas detection system using semiconductor laser with feedback compensation by gas reference cavity
有权
采用半导体激光器的气体检测系统，采用气体参比腔反馈补偿
- Patent Title: Gas detection system using semiconductor laser with feedback compensation by gas reference cavity
- Patent Title (中): 采用半导体激光器的气体检测系统，采用气体参比腔反馈补偿
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Application No.: US14503901Application Date: 2014-10-01
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Publication No.: US08928885B1Publication Date: 2015-01-06
- Inventor: Fei Luo , Lianqing Zhu , Mingli Dong , Wei He , Yinmin Zhang
- Applicant: Beijing Information Science & Technology University
- Applicant Address: CN Beijing
- Assignee: Beijing Information Science & Technology University
- Current Assignee: Beijing Information Science & Technology University
- Current Assignee Address: CN Beijing
- Agency: Morris, Manning & Martin, LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: CN201310479226 20131014
- Main IPC: G01N21/61
- IPC: G01N21/61 ; G01N21/27
Abstract:
A gas detection system using a semiconductor laser with a reference gas cavity compensation is provided, said system comprising a first light source emitting a first beam of a first wavelength as a detection beam; a second light source emitting a second beam of a second wavelength, which is different from the first wavelength, as a reference beam; a first wavelength division multiplexer connected with said first light source and said second light source; a broadband coupler connected with said first wavelength division multiplexer; a reference gas chamber, which is introduced with reference gas of the same composition as that of the gas to be detected and of a known concentration; a detection gas chamber, which is introduced with the gas to be detected.
Information query
