Invention Grant
- Patent Title: Surface measuring device having two measuring units
- Patent Title (中): 表面测量装置有两个测量单元
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Application No.: US12575350Application Date: 2009-10-07
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Publication No.: US08928886B2Publication Date: 2015-01-06
- Inventor: Konrad Lex
- Applicant: Konrad Lex
- Applicant Address: DE
- Assignee: BYK-Gardner GmbH
- Current Assignee: BYK-Gardner GmbH
- Current Assignee Address: DE
- Agency: Hayes Soloway P.C.
- Priority: DE102008051513 20081014
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01B11/30 ; G01N21/57

Abstract:
An apparatus for determining optical properties of materials including a first measuring device having a first radiation device which directs radiation onto the material under a first specified angle of radiation and a first radiation detection device which is located under a first angle of reception with respect to the material, and a second measuring device which includes a second radiation device which directs radiation onto the material under a second specified angle of radiation and a second radiation detection device which is located at a second angle of reception with respect to the material and allows a locally resolved evaluation of the radiation incident thereon and emits at least one second characteristic signal which is characteristic of the radiation incident on the second radiation detection device.
Public/Granted literature
- US20100091269A1 SURFACE MEASURING DEVICE HAVING TWO MEASURING UNITS Public/Granted day:2010-04-15
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