Invention Grant
- Patent Title: Method and apparatus for simultaneous acquisition of multiple examination data
- Patent Title (中): 同时采集多个检查数据的方法和装置
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Application No.: US10286673Application Date: 2002-11-01
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Publication No.: US08929620B2Publication Date: 2015-01-06
- Inventor: Stephanie A. Short , Mohamed Ali Hamadeh , Sundar Swamy , Anil Issac , Renuka Uppaluri , Renaud B. Maloberti , Jianqing Yao , Lloyd W. Ison
- Applicant: Stephanie A. Short , Mohamed Ali Hamadeh , Sundar Swamy , Anil Issac , Renuka Uppaluri , Renaud B. Maloberti , Jianqing Yao , Lloyd W. Ison
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06F19/00 ; G06Q50/22

Abstract:
Disclosed is an image acquisition workstation including a multiple examination mode. In the multiple examination mode, a user selects an anatomical view or procedure prior to acquiring data. When the image data is acquired, the acquired data is stored in a data structure related to the selected procedure or anatomical view. As the user selects a procedure or anatomical view prior to each data acquisition, the image acquisitions can be acquired in any order.
Public/Granted literature
- US20040086202A1 Method and apparatus for simultaneous acquisition of multiple examination data Public/Granted day:2004-05-06
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