Invention Grant
US08930146B2 Apparatus state detector, method for detecting apparatus state, apparatus state detection server and apparatus state detection system; living persons' anomaly detector, living persons' anomaly detection system and method for detecting living persons' anomaly, and apparatus-state database maintenance server
有权
设备状态检测器,装置状态检测方法,装置状态检测服务器及装置状态检测系统; 生活人员异常检测器,生活人员异常检测系统及生活人员异常检测方法,仪器状态数据库维护服务器
- Patent Title: Apparatus state detector, method for detecting apparatus state, apparatus state detection server and apparatus state detection system; living persons' anomaly detector, living persons' anomaly detection system and method for detecting living persons' anomaly, and apparatus-state database maintenance server
- Patent Title (中): 设备状态检测器,装置状态检测方法,装置状态检测服务器及装置状态检测系统; 生活人员异常检测器,生活人员异常检测系统及生活人员异常检测方法,仪器状态数据库维护服务器
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Application No.: US12919296Application Date: 2009-03-18
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Publication No.: US08930146B2Publication Date: 2015-01-06
- Inventor: Makoto Katsukura , Masanori Nakata , Noriyuki Kushiro , Takeru Kuroiwa , Toshiyasu Higuma , Naoyuki Hibara , Yoshiaki Ito
- Applicant: Makoto Katsukura , Masanori Nakata , Noriyuki Kushiro , Takeru Kuroiwa , Toshiyasu Higuma , Naoyuki Hibara , Yoshiaki Ito
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2008-103298 20080411; JP2008-126973 20080514; JP2008-278049 20081029; JPPCT/JP2009/053316 20090225
- International Application: PCT/JP2009/055240 WO 20090318
- International Announcement: WO2009/125659 WO 20091015
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01R31/28 ; G01D4/00 ; G08B21/04

Abstract:
An apparatus state detector and its associates are provided to save time and effort for learning combinations of operation states of all apparatuses at home and commit fewer estimation errors even when an unknown apparatus starts operating. The apparatus state detector includes measuring means that measures a physical quantity of an environment in which an apparatus is placed, feature-quantity calculation means that calculates a feature quantity of the measured value measured by the measuring means, storage means that stores in advance the feature quantity of each apparatus and an apparatus state associated with the feature quantity in a reference-apparatus entry dictionary, and apparatus-state detection means that searches the reference-apparatus entry dictionary for a feature quantity by using a feature quantity calculated by the feature-quantity calculation means as a search key and detects an apparatus state based on the apparatus state associated with the retrieved feature quantity.
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