Invention Grant
US08930154B2 First and second voltage measurements to adjust a voltage measurer
有权
第一次和第二次电压测量来调整电压测量器
- Patent Title: First and second voltage measurements to adjust a voltage measurer
- Patent Title (中): 第一次和第二次电压测量来调整电压测量器
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Application No.: US13355315Application Date: 2012-01-20
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Publication No.: US08930154B2Publication Date: 2015-01-06
- Inventor: Ted A Hadley
- Applicant: Ted A Hadley
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agent Caroline Pinkston
- Main IPC: G06F21/72
- IPC: G06F21/72 ; G06F13/16 ; H04L9/32 ; G06F21/54 ; G06F21/75 ; H04L9/08 ; G06F1/24 ; G06F21/57 ; G06F12/14 ; G06F21/60 ; G06F21/55
Abstract:
Examples disclose a processor with a measurement point to receive an input voltage and a voltage measurer to obtain a first voltage measurement. Further, the examples provide the processor with a switch, based on a signal, to enable a second voltage measurement at the measurement point. Additionally, the processor is to adjust the voltage measurer based on a difference between the first and second voltage measurements.
Public/Granted literature
- US20130024143A1 FIRST AND SECOND VOLTAGE MEASUREMENTS TO ADJUST A VOLTAGE MEASURER Public/Granted day:2013-01-24
Information query
