Invention Grant
US08930159B2 Semiconductor circuit, semiconductor device, line break detection method, and computer readable medium storing line break detection program
有权
半导体电路，半导体器件，断线检测方法以及存储断线检测程序的计算机可读介质
- Patent Title: Semiconductor circuit, semiconductor device, line break detection method, and computer readable medium storing line break detection program
- Patent Title (中): 半导体电路，半导体器件，断线检测方法以及存储断线检测程序的计算机可读介质
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Application No.: US13344696Application Date: 2012-01-06
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Publication No.: US08930159B2Publication Date: 2015-01-06
- Inventor: Naoaki Sugimura
- Applicant: Naoaki Sugimura
- Applicant Address: JP Yokohama
- Assignee: Lapis Semiconductor Co., Ltd.
- Current Assignee: Lapis Semiconductor Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: JP2011-003402 20110111
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/02 ; G01R35/00 ; G06F11/00 ; G01R19/165 ; G01R31/36
Abstract:
When line break detection of signal line Ln is carried out, potential smaller than signal line Ln−1 having lower potential than signal line Ln is supplied to signal line Ln, and potentials of signal line Ln and signal line Ln−1 are compared. If potential of signal line Lc>signal line Li, it is detected no line break, and if signal line Lc signal line Li, it is detected that a line break exists.
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