Invention Grant
- Patent Title: Source localization using multiple units of a tight-pitched detector array
- Patent Title (中): 源定位使用多个单位的紧密检测器阵列
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Application No.: US12881943Application Date: 2010-09-14
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Publication No.: US08930165B2Publication Date: 2015-01-06
- Inventor: Richard B. Vilim , Raymond T. Klann
- Applicant: Richard B. Vilim , Raymond T. Klann
- Applicant Address: US IL Chicago
- Assignee: UChicago Argonne, LLC
- Current Assignee: UChicago Argonne, LLC
- Current Assignee Address: US IL Chicago
- Agency: Foley & Lardner LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01T1/29 ; G06F17/18 ; G01T7/00

Abstract:
A system and method for determining a probability of the location of an illicit radiation source within an environment based on directional detectors. An embodiment includes a plurality of directional radiation detectors distributed about the environment and integrated with a processing unit adapted to determine the probability of the source location based on the radiation count data received from the plurality of detectors. The processing unit is further adapted to output information indicative of the location of the radiation source within the environment.
Public/Granted literature
- US20110246137A1 SOURCE LOCALIZATION USING MULTIPLE UNITS OF A TIGHT-PITCHED DETECTOR ARRAY Public/Granted day:2011-10-06
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