Invention Grant
- Patent Title: Attribute importance measure for parametric multivariate modeling
- Patent Title (中): 参数多变量建模的属性重要性度量
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Application No.: US12941455Application Date: 2010-11-08
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Publication No.: US08930170B2Publication Date: 2015-01-06
- Inventor: Jason A. McLennan
- Applicant: Jason A. McLennan
- Applicant Address: US TX Houston
- Assignee: ConocoPhillips Company
- Current Assignee: ConocoPhillips Company
- Current Assignee Address: US TX Houston
- Agency: ConocoPhillips Company
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06G7/48 ; G06F17/18

Abstract:
Parametric Bayesian Updating method is described for attribute importance measures. AIM is a quantitative measure of the relative importance of multiple attributes used in a Bayesian Updating parametric multivariate modeling approach. The AIM is a function of the correlation coefficients between the attributes themselves and the attributes with collocated target variable. The importance calculation is straightforward, repeatable, and objective.
Public/Granted literature
- US20110119040A1 ATTRIBUTE IMPORTANCE MEASURE FOR PARAMETRIC MULTIVARIATE MODELING Public/Granted day:2011-05-19
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