Invention Grant
- Patent Title: Operation processing device and method of detecting memory leak
- Patent Title (中): 检测内存泄漏的操作处理装置和方法
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Application No.: US13046969Application Date: 2011-03-14
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Publication No.: US08930661B2Publication Date: 2015-01-06
- Inventor: Masafumi Hashiguchi
- Applicant: Masafumi Hashiguchi
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2010-71056 20100325
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06F17/30 ; G06F11/07

Abstract:
A memory leak detecting method includes: producing an object which occupies an area on a first area of the memory; checking a presence of a pointer which points at the object separately so as to remove the object and to repeatedly carry out a process for increasing a counter value of the object; moving the object from the area on the first area of the memory to an area on the second area of the memory when the counter value exceeding a first threshold; and moving the object from the area on the second area to the area on the first area and clearing the counter value of the object upon the object occupying the area on the second area.
Public/Granted literature
- US20110238940A1 OPERATION PROCESSING DEVICE AND METHOD OF DETECTING MEMORY LEAK Public/Granted day:2011-09-29
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