Invention Grant
US08930711B2 Critical security parameter generation and exchange system and method for smart-card memory modules
有权
智能卡内存模块的关键安全参数生成与交换系统及方法
- Patent Title: Critical security parameter generation and exchange system and method for smart-card memory modules
- Patent Title (中): 智能卡内存模块的关键安全参数生成与交换系统及方法
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Application No.: US13437613Application Date: 2012-04-02
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Publication No.: US08930711B2Publication Date: 2015-01-06
- Inventor: Mehdi Asnaashari , Ruchirkumar D. Shah , Sylvain Prevost , Ksheerabdhi Krishna
- Applicant: Mehdi Asnaashari , Ruchirkumar D. Shah , Sylvain Prevost , Ksheerabdhi Krishna
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F21/00
- IPC: G06F21/00 ; H04L29/06 ; G06Q20/34 ; G06F21/77 ; G06F21/79 ; H04W12/10 ; G06F12/14 ; G06F21/34

Abstract:
A storage device contains a smart-card device and a memory device, which is connected to a controller. The storage device may be used in the same manner as a conventional smart-card device, or it may be used to store a relatively large amount of data. The memory device may also be used to store data or instructions for use by the smart-card device. The controller includes a security engine that uses critical security parameters stored in, and received from, the smart-card device. The critical security parameters may be sent to the controller in a manner that protects them from being discovered. The critical security parameters may be encryption and/or decryption keys that may encrypt data written to the memory device and/or decrypt data read from the memory device, respectively. Data and instructions used by the smart-card device may therefore stored in the memory device in encrypted form.
Public/Granted literature
- US20120191975A1 CRITICAL SECURITY PARAMETER GENERATION AND EXCHANGE SYSTEM AND METHOD FOR SMART-CARD MEMORY MODULES Public/Granted day:2012-07-26
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