Invention Grant
- Patent Title: Method and apparatus for defect recovery
- Patent Title (中): 缺陷恢复方法和装置
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Application No.: US13301199Application Date: 2011-11-21
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Publication No.: US08930781B2Publication Date: 2015-01-06
- Inventor: Estuardo Licona , Mats Oberg
- Applicant: Estuardo Licona , Mats Oberg
- Applicant Address: BB St. Michael
- Assignee: Marvell World Trade Ltd.
- Current Assignee: Marvell World Trade Ltd.
- Current Assignee Address: BB St. Michael
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11B20/10 ; G11B27/36 ; G11B20/18

Abstract:
A signal processing circuit includes a plurality of processing-circuit modules and a logic control circuit. The plurality of processing-circuit modules is configured to process an electrical signal. The plurality of processing-circuit modules has at least one processing parameter that is adaptively adjusted based on the electrical signal. The logic control circuit is configured to receive signals from the plurality of processing-circuit modules, validate the processing based on the received signals, and control a storage circuit to sample and store a value of the processing parameter when the processing is validated. Further, the logic control circuit is configured to control the storage circuit to maintain the value of processing parameter when the processing fails validation, and to control the storage circuit to recover the processing parameter in the plurality of processing-circuit modules to the stored value when the plurality of processing-circuit modules is disturbed by a defect.
Public/Granted literature
- US20120131405A1 METHOD AND APPARATUS FOR DEFECT RECOVERY Public/Granted day:2012-05-24
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