Invention Grant
US08930781B2 Method and apparatus for defect recovery 有权
缺陷恢复方法和装置

Method and apparatus for defect recovery
Abstract:
A signal processing circuit includes a plurality of processing-circuit modules and a logic control circuit. The plurality of processing-circuit modules is configured to process an electrical signal. The plurality of processing-circuit modules has at least one processing parameter that is adaptively adjusted based on the electrical signal. The logic control circuit is configured to receive signals from the plurality of processing-circuit modules, validate the processing based on the received signals, and control a storage circuit to sample and store a value of the processing parameter when the processing is validated. Further, the logic control circuit is configured to control the storage circuit to maintain the value of processing parameter when the processing fails validation, and to control the storage circuit to recover the processing parameter in the plurality of processing-circuit modules to the stored value when the plurality of processing-circuit modules is disturbed by a defect.
Public/Granted literature
Information query
Patent Agency Ranking
0/0