Invention Grant
- Patent Title: pBIST read only memory image compression
- Patent Title (中): pBIST只读内存图像压缩
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Application No.: US13709188Application Date: 2012-12-10
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Publication No.: US08930783B2Publication Date: 2015-01-06
- Inventor: Raguram Damodaran , Naveen Bhoria , Aman Kokrady
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Robert D. Marshall, Jr.; Frederick J. Telecky, Jr.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G11C29/12 ; G01R31/3185 ; G11C29/36
Abstract:
A programmable Built In Self Test (pBIST) system used to test embedded memories where a plurality of memories requiring different testing conditions are incorporated in an SOC. The pBIST Read Only Memory storing the test setup data is organized to eliminate multiple instances of test setup data for similar embedded memories.
Public/Granted literature
- US20140164855A1 pBIST READ ONLY MEMORY IMAGE COMPRESSION Public/Granted day:2014-06-12
Information query
